LEED Auger Electron Spectroscopy
The Low Energy Electron Diffraction experiment uses a beam of electrons of a well-defined low energy (typically in the range 20 – 200 eV) incident normally on the sample. The sample itself must be a single crystal with a well-ordered surface structure in order to generate a back-scattered electron diffraction pattern.
LEED Imaging Software
Real-time image display, Single or multiple frames capture.
Frame averaging and integration supported in all modes.
Dynamic adjustment of brightness and contrast.
Enhancement by background subtraction and contrast stretching (linear or non-linear).
Images exported as standard bitmaps.
Capture movies to hard disk (up to 10fps).
Movies can be analysed later using all features of Low Energy Electron Diffraction express, LEED Imaging or LEED Office.
LEED IV Intensity Vs Energy I(V) Measurements
Real-time display LEED IV of intensity and up to 18 spot positions.
Record I(V) movie, measurements through movie features.
Spot tracking manual, automatic and Template with variable retention intensity.
R-Factor Analysis for crystal alignment.
Average I(V) spectra.
LEED IV Analysis Spots and Profiles
Multiple dynamic line profiles in any direction.
Real-time line profiles.
Manual or automatic spot and line management.
Saturated spot diffusion.
Automatic calculation of spot size.
Peak locking on spot and Auto default size of spot.
LEED Imaging Software
Works with any CCIR standard camera.
On-camera integration option using Cohu 4910 camera.
Sync correction for VCRs.
Wide range of black and white level adjustment.
512X512 area from CCIR 768X576 frame.
LEED Energy and Target Current
LEED Data Acquisition Software
Energy control 0-10V for 0eV to 1000eV(Programmable).
Target current and External input measurements.
LEED Data Acquisition Software Options
Computer.
CCIR Camera and Time integration module.
Customised software.
LEED IT Intensity Vs Time I(t) Measurements
Live display of time analysis.
Playback I(t) measurements through movie feature.
Smoothing.
