Auger/ XPS Of Surface Science Software
Data acquisition and processing software. Ideal for the RFA, CMA and Hemispherical electron analyser applications.
Auger electron spectroscopy is a analytical technique used specifically for studying surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come to be called, which is based on the analysis of energetic electrons emitted from an excited atom after a series of internal relaxation events.
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0 to 10 nm of the material being analyzed.
Auger Data Acquisition
Full user choice of acquisition parameters.
Multiple scan.
Up to 10 acquisition scans per experiment.
Repetitive fast scan mode for sample set up.
Target current monitoring.
Analogue mode for LIA acquisition.
Digital mode with 20Mc/s counter for pulse counting application.
Automatic save of data.
Multiple spectrum display for comparison.
Context sensitive help.
Auto Zoom and Expand facility.
Direct energy mapping to DAC.
Auto and manual re-scaling during run.
Auger Data Processing
Savitzky-Golay fitting analysis.
Background subtraction options.
Peak half width determination.
Spectrum addition and subtraction.
Smoothing options.
Manual despike facility.
Integration and differentiation.
Full annotation.
Full bitmap save facility for spectrum.
Options for the Software
Computer.
Customised software and hardware.
Fast scan and peak detector
Peak finder for a fixed energy.
Pause and continuous scan facility.
Real-time oscilloscope trace with dynamic parameters.
