SAM/SEM Of Surface Science Software 

scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the detected signal to produce an image. It can achieve resolution better than 1 nanometer. Specimens are observed in high vacuum in conventional SEM, or in low vacuum or wet conditions in variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.

The most common SEM mode is detection of secondary electrons emitted by atoms excited by the electron beam. The number of secondary electrons that can be detected depends, among other things, on specimen topography. By scanning the sample and collecting the secondary electrons that are emitted using a special detector, an image displaying the topography of the surface is created.

SEM image processing

Brightness 
Contrast 
Exported as bit map (.bmp)

Hardware

Computer interface 
All necessary cables

System upgrades

XP 
SAMSEM 
gun controller

SEM/SAM Image

SEM image acquisition

Full 32 bit image data 
Dynamic scan display 
Scanning speed adjustable for the 
desired signal-to-noise ratio 
64×64, 128×128, 256×256, 
512×512, 1024×1024 display mode 
Image input can be analog or digital 
Load and save 32 bit facility 
Auto dynamic range display 
Adjustable gain

Scanning Auger Microscopy ( SAM )

The incident primary electrons cause ionization of atoms within the region illuminated by the focused beam. Subsequent relaxation of the ionized atoms leads to the emission of Auger electrons characteristic of the elements present in this part of the sample surface.

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